NI PXIe-4141 Precision PXI Source Measurement Unit (SMU)

Brand:NI
Model:PXIe-4141
Warranty period: One year
Contact: Sissie
Contact :+ 86-15339537573 (wechat)
Email: 2054523139@qq.com

Description

The NI PXIe-4141 is a precision PXI source measurement unit (SMU) manufactured by National Instruments (NI) and used in a wide range of industries and sectors. Here is a detailed description of the product:

Basic information
Brand: National Instruments (NI)
Model: PXIe-4141
Country of Origin: USA
Application fields: biological industry, mining, energy, transportation, printing and packaging and other industries
Technical characteristics
High channel count: The NI PXIe-4141 is a four-channel SMU, each with independent source and measurement functions, suitable for applications requiring multi-channel measurement.
High accuracy: The module provides highly accurate current and voltage measurement capabilities that accurately capture the electrical characteristics of the device.
High-speed sampling: With high-speed sampling rate, it can capture the electrical characteristics of the equipment in the transient state in real time, improving the test efficiency and accuracy.
Flexible configuration: The input data format can be configured as a floating point IEEE 32-bit or a 16-bit integer in a 32-bit field to meet different test requirements.
Next-generation SourceAdapt technology: The NI PXIe-4141 features this technology that allows engineers to customize the SMU output for any given load to achieve maximum stability and minimum transient times.
Main parameter
Input range: Current supports 0 20mA and 4 20mA
Backplane power requirements: Specific requirements may vary depending on the configuration
Input impedance: Voltage input impedance is greater than 100 kΩ, current input resistance is 249 Ω±1%
Open circuit detection time: up to 1 second
Overvoltage and overcurrent protection: Support ±60 VDC continuous overvoltage and ±28mA continuous overcurrent protection
Application scenario
The NI PXIe-4141 is suitable for a variety of test scenarios, including but not limited to semiconductor testing, electronic component testing, materials research, biomedical engineering and other fields. Its high precision, high speed sampling and flexible configuration make it play an important role in these fields.

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